描述：ZJ-3型Piezo型壓(ya)電(dian)常數測試(shi)儀(yi)（靜(jing)壓電(dian)系數d33測量儀(yi)）是為(wei)測量壓(ya)電(dian)材料(liao)的(de)d33常數而設計(ji)的專(zhuan)用(yong)儀(yi)器，它可用(yong)來(lai)測量具(ju)有大(da)壓電(dian)常數的(de)壓電(dian)陶瓷(ci)，小(xiao)壓(ya)電(dian)常數的(de)壓電(dian)單(dan)晶及壓電(dian)高(gao)分(fen)子(zi)材料(liao)。此(ci)外，也(ye)可(ke)測量任(ren)意(yi)取向壓電(dian)單(dan)晶以(yi)及(ji)某些(xie)壓(ya)電(dian)器件的等(deng)效(xiao)壓(ya)電(dian)d’33常數，儀(yi)器測量範(fan)圍寬，分(fen)辨(bian)率(lv)細，可(ke)靠(kao)性(xing)高(gao)，操(cao)作簡(jian)單(dan)，對試(shi)樣大小(xiao)及(ji)形狀無特殊(shu)要(yao)求(qiu)，圓(yuan)片(pian)、圓(yuan)環(huan)、圓(yuan)管、方(fang)塊、長(chang)條、柱形及半(ban)球(qiu)殼等(deng)均(jun)可測量，測量結(jie)果和(he)極性(xing)在(zai)三

ZJ-3型(xing)Piezo型(xing)壓電(dian)常數測試(shi)儀(yi)（靜(jing)壓電(dian)系數d33測量儀(yi)）

  目前(qian)我(wo)們國家對材料(liao)測試(shi)越來(lai)越重(zhong)視(shi)，很(hen)多單(dan)位及科研院校對(dui)產品(pin)甄別(bie)出(chu)現(xian)很(hen)大(da)問(wen)題，但是真(zhen)正測試(shi)材料(liao)需要(yao)選擇(ze)壹(yi)款(kuan)精(jing)準可(ke)靠(kao)的(de)測試(shi)產品(pin)，這(zhe)樣對自(zi)己的測試(shi)成果(guo)及(ji)研究(jiu)會帶(dai)來(lai)很(hen)大(da)的(de)作(zuo)用(yong),對(dui)我(wo)們的生產帶(dai)來(lai)極(ji)大的(de)指導性(xing)作用(yong)。

ZJ-3型(xing)Piezo型壓電(dian)常數測試(shi)儀(yi)（靜(jing)壓電(dian)系數d33測量儀(yi)），PVDF壓電(dian)薄膜(mo)測試(shi)儀(yi)
關(guan)鍵詞(ci):壓(ya)電(dian),陶瓷(ci)材料(liao),高(gao)分(fen)子(zi),d33/d15

壹(yi)、產品(pin)介(jie)紹(shao)：

ZJ-3型(xing)Piezo型壓電(dian)常數測試(shi)儀(yi)（靜(jing)壓電(dian)系數d33測量儀(yi)）是為(wei)測量壓(ya)電(dian)材料(liao)的(de)d33常數而設計(ji)的專(zhuan)用(yong)儀(yi)器，它可用(yong)來(lai)測量具(ju)有大(da)壓電(dian)常數的(de)壓電(dian)陶瓷(ci)，小(xiao)壓(ya)電(dian)常數的(de)壓電(dian)單(dan)晶及壓電(dian)高(gao)分(fen)子(zi)材料(liao)。此(ci)外，也(ye)可(ke)測量任(ren)意(yi)取向壓電(dian)單(dan)晶以(yi)及(ji)某些(xie)壓(ya)電(dian)器件的等(deng)效(xiao)壓(ya)電(dian)d’33常數，儀(yi)器測量範(fan)圍寬，分(fen)辨(bian)率(lv)細，可(ke)靠(kao)性(xing)高(gao)，操(cao)作簡(jian)單(dan)，對試(shi)樣大小(xiao)及(ji)形狀無特殊(shu)要(yao)求(qiu)，圓(yuan)片(pian)、圓(yuan)環(huan)、圓(yuan)管、方(fang)塊、長(chang)條、柱形及半(ban)球(qiu)殼等(deng)均(jun)可測量，測量結(jie)果和(he)極性(xing)在(zai)三位(wei)半數字(zi)面板(ban)表(biao)上(shang)直接顯示(shi)。ZJ-3型增(zeng)加(jia)了對(dui)被測元(yuan)件的放(fang)電(dian)保護、放(fang)電(dian)提示(shi)以(yi)及(ji)被測波(bo)形輸出(chu)等(deng)功(gong)能(neng)，使(shi)得(de)儀器(qi)在(zai)測量未放(fang)電(dian)（尤其是(shi)較(jiao)大尺寸）的壓(ya)電(dian)元(yuan)件時具備(bei)了高(gao)電(dian)壓放(fang)電(dian)提示(shi)及保護功(gong)能(neng)，本(ben)儀器是(shi)從事壓電(dian)材料(liao)及(ji)壓電(dian)元(yuan)件生產、應用(yong)與研究(jiu)部(bu)門(men)的儀(yi)器。

二、主要(yao)應用(yong)領(ling)域：無損檢(jian)測超聲檢(jian)測，醫療超聲檢(jian)測，航空(kong)航天(tian)，石(shi)油天(tian)然(ran)器(qi)，汽車(che)物(wu)聯網(wang)，工業(ye)，消(xiao)費者程序等(deng)。

三(san)、參(can)考(kao)標(biao)準:
GB3389.4-82《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 縱(zong)向(xiang)壓(ya)電(dian)應變常數d33的(de)靜(jing)態測試(shi)》

GB/T3389.5-1995《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 圓(yuan)片(pian)厚(hou)度伸縮(suo)振動模式(shi)》

GB000?Tj1.1/T3389.4-1982《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 柱(zhu)體(ti)縱(zong)向(xiang)長(chang)度伸縮(suo)振動模式(shi)》

GB/T 3389.7-1986《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 強(qiang)場介電(dian)性能(neng)的測試(shi)》

GB/T3389.8-1986《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 熱釋電(dian)系數的(de)測試(shi)》
四(si)、產品(pin)主要(yao)功(gong)能(neng)：

﹡測量塊(kuai)體壓(ya)電(dian)材料(liao)的(de)d33常(chang)數

﹡測量具(ju)有大(da)壓電(dian)常數的(de)壓電(dian)陶瓷(ci)

﹡測量小(xiao)壓(ya)電(dian)常數的(de)壓電(dian)單(dan)晶及壓電(dian)高(gao)分(fen)子(zi)材料(liao) 

﹡測量任(ren)意(yi)取向壓電(dian)單(dan)晶以(yi)及(ji)某些(xie)壓(ya)電(dian)器件的等(deng)效(xiao)壓(ya)電(dian)d’33常(chang)數

﹡測量薄(bo)膜(mo)材料(liao)即(ji)PVDF等(deng)薄膜(mo)材料(liao)d33常(chang)數

五(wu)、主要(yao)技術(shu)指標 

d33測量範(fan)圍：

★ ×1擋(dang)：10到2000pC/N，20 至4000pC/N，可(ke)以(yi)升(sheng)級(ji)到10000PC/N.
★×0.1擋(dang)： 1到200pC/N，2 至400pC/N。

★可(ke)以(yi)配(pei)套(tao)PZT-JH10/4/8/12型(xing)壓電(dian)極化裝(zhuang)置(zhi)使(shi)用(yong)

★可(ke)以(yi)配(pei)套(tao)ZJ-D33-YP15壓(ya)電(dian)壓片(pian)機使(shi)用(yong)
誤(wu)差(cha)：×1擋(dang)：±2%±1個數字(zi)，當d33在(zai)100到4000pC/N；

D31塊(kuai)體夾具，D15塊(kuai)體夾具，D15圓(yuan)管夾具，D31塊(kuai)體夾具，薄(bo)膜(mo)拉伸(shen)夾具（新增(zeng)功(gong)能(neng)）,共面(mian)電(dian)極功(gong)能(neng)（新增(zeng)）

★計(ji)量標(biao)定標(biao)準(zhun)樣尺寸：18mm*0.8mm，老化時間：2-3年(nian)（評(ping)判(pan)壓(ya)電(dian)測試(shi)儀(yi)準確性能(neng)的重(zhong)要(yao)依據之(zhi)壹(yi)）
±5%±1個(ge)數字(zi)，當d33在(zai)10到200pC/N；
×0.1擋(dang)：±2%±1個數字(zi)，(當d33在(zai)10到200pC/N)
±5%±1個(ge)數字(zi)，當d33在(zai)10到20pC/N。
分(fen)辨(bian)率(lv)：   ×1擋(dang)：1 pC/N；×0.1擋：0.1 pC/N。
尺寸：施力裝置(zhi)：Φ110×140mm；儀(yi)器本(ben)體：240×200×80mm。
重(zhong)量：施力裝置(zhi)：約(yue)4公斤；   
儀(yi)器本(ben)體：2公斤。
電(dian)源：220伏(fu)，50赫(he)，20瓦(wa)。

★補(bu)充參(can)數:

ZJ-3型(xing)piezo壓電(dian)常數測試(shi)儀(yi)，PVDF壓(ya)電(dian)薄膜(mo)測試(shi)儀(yi)

ZJ-3 piezoelectric tester (static pressure coefficient d33 measuring instrument), PVDF piezoelectric film tester

關(guan)鍵詞(ci):壓(ya)電(dian),陶瓷(ci)材料(liao),高(gao)分(fen)子(zi),d33/d15

Keywords: piezoelectric, ceramic materials, polymers, d33/d15

壹(yi)、產品(pin)介(jie)紹(shao)：

1、 Product Introduction:

ZJ-3型(xing)壓電(dian)測試(shi)儀(yi)（靜(jing)壓電(dian)系數d33測量儀(yi)）是為(wei)測量壓(ya)電(dian)材料(liao)的(de)d33常數而設計(ji)的專(zhuan)用(yong)儀(yi)器，它可用(yong)來(lai)測量具(ju)有大(da)壓電(dian)常數的(de)壓電(dian)陶瓷(ci)，小(xiao)壓(ya)電(dian)常數的(de)壓電(dian)單(dan)晶及壓電(dian)高(gao)分(fen)子(zi)材料(liao)。此(ci)外，也(ye)可(ke)測量任(ren)意(yi)取向壓電(dian)單(dan)晶以(yi)及(ji)某些(xie)壓(ya)電(dian)器件的等(deng)效(xiao)壓(ya)電(dian)d’33常數，儀(yi)器測量範(fan)圍寬，分(fen)辨(bian)率(lv)細，可(ke)靠(kao)性(xing)高(gao)，操(cao)作簡(jian)單(dan)，對試(shi)樣大小(xiao)及(ji)形狀無特殊(shu)要(yao)求(qiu)，圓(yuan)片(pian)、圓(yuan)環(huan)、圓(yuan)管、方(fang)塊、長(chang)條、柱形及半(ban)球(qiu)殼等(deng)均(jun)可測量，測量結(jie)果和(he)極性(xing)在(zai)三位(wei)半數字(zi)面板(ban)表(biao)上(shang)直接顯示(shi)。ZJ-3型增(zeng)加(jia)了對(dui)被測元(yuan)件的放(fang)電(dian)保護、放(fang)電(dian)提示(shi)以(yi)及(ji)被測波(bo)形輸出(chu)等(deng)功(gong)能(neng)，使(shi)得(de)儀器(qi)在(zai)測量未放(fang)電(dian)（尤其是(shi)較(jiao)大尺寸）的壓(ya)電(dian)元(yuan)件時具備(bei)了高(gao)電(dian)壓放(fang)電(dian)提示(shi)及保護功(gong)能(neng)，本(ben)儀器是(shi)從事壓電(dian)材料(liao)及(ji)壓電(dian)元(yuan)件生產、應用(yong)與研究(jiu)部(bu)門(men)的儀(yi)器。

The ZJ-3 piezoelectric tester (static pressure coefficient d33 measuring instrument) is a specialized instrument designed to measure the d33 constant of piezoelectric materials. It can be used to measure piezoelectric ceramics with large piezoelectric constants, piezoelectric single crystals with small piezoelectric constants, and piezoelectric polymer materials. In addition, it can also measure the equivalent piezoelectric d'33 constant of any oriented piezoelectric single crystal and certain piezoelectric devices. The instrument has a wide measurement range, fine resolution, high reliability, simple operation, and no special requirements for sample size and shape. Circular discs, rings, tubes, blocks, strips, columns, and hemispherical shells can be measured, and the measurement results and polarity are directly displayed on a three and a half digit panel meter. The ZJ-3 model has added functions such as discharge protection, discharge prompt, and waveform output for the tested components, enabling the instrument to provide high-voltage discharge prompt and protection when measuring non discharged (especially large-sized) piezoelectric components. This instrument is an essential tool for the production, application, and research departments of piezoelectric materials and components.

二、主要(yao)應用(yong)領(ling)域：無損檢(jian)測超聲檢(jian)測，醫療超聲檢(jian)測，航空(kong)航天(tian)，石(shi)油天(tian)然(ran)器(qi)，汽車(che)物(wu)聯網(wang)，工業(ye)，消(xiao)費者程序等(deng)。

 Main application areas: non-destructive testing ultrasonic testing, medical ultrasonic testing, aerospace, oil and gas equipment, automotive IoT, navy, industry, consumer programs, etc.

三(san)、參(can)考(kao)標(biao)準:

3、 Reference standards:

GB3389.4-82 "Testing Methods for Properties of Piezoelectric Ceramic Materials - Static Test of Longitudinal Piezoelectric Strain Constant d33"

GB/T3389.5-1995 "Testing methods for properties of piezoelectric ceramic materials - Circular thickness expansion vibration mode"

GB000? Tj1.1/T3389.4-1982 "Testing Method for Properties of Piezoelectric Ceramic Materials - Longitudinal Length Expansion Vibration Mode of Column"

GB/T 3389.7-1986 "Test Methods for Properties of Piezoelectric Ceramic Materials - Test for Strong Field Dielectric Properties"

GB/T3389.8-1986 "Testing Method for Properties of Piezoelectric Ceramic Materials - Test for Pyroelectric Coefficient"

GB3389.4-82《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 縱(zong)向(xiang)壓(ya)電(dian)應變常數d33的(de)靜(jing)態測試(shi)》

GB/T3389.5-1995《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 圓(yuan)片(pian)厚(hou)度伸縮(suo)振動模式(shi)》

GB000?Tj1.1/T3389.4-1982《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 柱(zhu)體(ti)縱(zong)向(xiang)長(chang)度伸縮(suo)振動模式(shi)》

GB/T 3389.7-1986《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 強(qiang)場介電(dian)性能(neng)的測試(shi)》

GB/T3389.8-1986《壓(ya)電(dian)陶瓷(ci)材料(liao)性(xing)能(neng)測試(shi)方(fang)法(fa) 熱釋電(dian)系數的(de)測試(shi)》

四(si)、產品(pin)主要(yao)功(gong)能(neng)：

4、 Main functions of the product:

Measure the d33 constant of bulk piezoelectric materials

Measurement of piezoelectric ceramics with large piezoelectric constants

Measurement of small piezoelectric constants in piezoelectric single crystals and piezoelectric polymer materials

Measure the equivalent piezoelectric d'33 constant of arbitrary orientation piezoelectric single crystals and certain piezoelectric devices

Measure the d33 constant of thin film materials such as PVDF

﹡測量塊(kuai)體壓(ya)電(dian)材料(liao)的(de)d33常(chang)數

﹡測量具(ju)有大(da)壓電(dian)常數的(de)壓電(dian)陶瓷(ci)

﹡測量小(xiao)壓(ya)電(dian)常數的(de)壓電(dian)單(dan)晶及壓電(dian)高(gao)分(fen)子(zi)材料(liao)  

﹡測量任(ren)意(yi)取向壓電(dian)單(dan)晶以(yi)及(ji)某些(xie)壓(ya)電(dian)器件的等(deng)效(xiao)壓(ya)電(dian)d’33常(chang)數

﹡測量薄(bo)膜(mo)材料(liao)即(ji)PVDF等(deng)薄膜(mo)材料(liao)d33常(chang)數

五(wu)、主要(yao)技術(shu)指標

5、 Main technical indicators

D33 measurement range:

★× 1st gear: 10 to 2000pC/N, 20 to 4000pC/N, can be upgraded to 10000PC/N

★× 0.1 gear: 1 to 200pC/N, 2 to 400pC/N.

★ Can be used with PZT-JH10/4/8/12 piezoelectric polarization device

★ Can be used with ZJ-D33-YP15 voltage chip machine

Error: * 1 gear: ± 2% ± 1 digit, when d33 is between 100 and 4000pC/N;

D31 block fixture, D15 block fixture, D15 circular tube fixture, D31 block fixture, thin film stretching fixture (new function), coplanar electrode function (new)

★ Measurement calibration standard sample size: 18mm * 0.8mm, aging time: 2-3 years (one of the important criteria for evaluating the accuracy performance of piezoelectric testers)

± 5% ± 1 digit, when d33 is between 10 and 200pC/N;

0.1 gear: ± 2% ± 1 digit (when d33 is between 10 and 200pC/N)

± 5% ± 1 digit, when d33 is between 10 and 20pC/N.

Resolution: × 1 gear: 1 pC/N; 0.1 gear: 0.1 pC/N.

Size: Force application device: Φ 110 × 140mm; Instrument body: 240 × 200 × 80mm.

Weight: Force application device: approximately 4 kilograms;

Instrument body: 2 kilograms.

Power supply: 220V, 50Hz, 20W.

★ Supplementary parameters:

Frequency bandwidth DC~7MHz

Y deflection coefficient 10mV/div~5V/div, divided into 9 levels

X deflection coefficient 0.2 μ S/div~0.1S/div, divided into 18 levels

X exte